Abstract
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high lateral and energy resolution can be realized. © 2007 Springer Science+Business Media, LLC.
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CITATION STYLE
Glatzel, T., Lux-Steiner, M. C., Strassburg, E., Boag, A., & Rosenwaks, Y. (2007). Principles of kelvin probe force microscopy. In Scanning Probe Microscopy (Vol. 2, pp. 113–131). Springer New York. https://doi.org/10.1007/978-0-387-28668-6_5
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