Testing HSSIs with or without ATE Instruments

Abstract

This chapter introduces techniques that do not relay on high-speed ATE instruments for both the transmitter and the receiver testing that is discussed in Chapter 3 and Chapter 4, respectively. We describe the principles of the design of FPGA-based test equipment, including Bit Error Rate Tester (BERT), pseudorandom noise injection and channel emulation. Then, we provide the details of a complete standalone tester that uses relays and/or MEMS-based switching devices. The advantages and disadvantages of the state-of-the art in each such case are presented.