Scaling up a metric learning algorithm for image recognition and representation

Abstract

Maximally Collapsing Metric Learning is a recently proposed algorithm to estimate a metric matrix from labelled data. The purpose of this work is to extend this approach by considering a set of landmark points which can in principle reduce the cost per iteration in one order of magnitude. The proposal is in fact a generalized version of the original algorithm that can be applied to larger amounts of higher dimensional data. Exhaustive experimentation shows that very similar behavior at a lower cost is obtained for a wide range of the number of landmark points used. © 2008 Springer Berlin Heidelberg.