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XUtils Ver. 1: A Set of Gatan DigitalMicrograph Plug-ins for Characterization of XEDS-Detector Performance Parameters in an AEM

  • Watanabe M
Microscopy and Microanalysis (2010) 16(S2) 260-261
DOI: 10.1017/s1431927610056783
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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APA

Watanabe, M. (2010). XUtils Ver. 1: A Set of Gatan DigitalMicrograph Plug-ins for Characterization of XEDS-Detector Performance Parameters in an AEM. Microscopy and Microanalysis, 16(S2), 260–261. https://doi.org/10.1017/s1431927610056783

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