Heteroepitaxial growth of III-V compound semiconductors for optoelectronic devices

5Citations
Citations of this article
5Readers
Mendeley users who have this article in their library.

Abstract

An AlGaAs/GaAs multi-quantum well vertical-cavity surface-emitting laser diode (VCSELD) has been grown on a Si substrate using metalorganic chemical vapour deposition (MOCVD). The VCSELD with a 23-pair of AlAs/Al0.1Ga0.9As distributed Bragg reflector on a Si substrate exhibited a threshold current of 223 mA under continuous-wave condition at 220 K. Electroluminescence observation showed that an optical degradation was caused by generation and growth of dark-line defects. An MOCVD-grown InGaN/AlGaN double-heterostructure light-emitting diode on a sapphire substrate exhibited an optical output power of 0.17 mW, an external quantum efficiency of 0.2%, a peak emission wavelength at 440 nm with a full width at half-maximum of 63 nm and a stable operation up to 3000 h under 30 mA DC operation at 30°C. A high current level of 281 mA/mm and a large transconductance (gm) of 33 mS/mm have been achieved for a GaN metal semiconductor field-effect transistor (MESFET) with a gate length of 2 μm and a width of 200 μm at 25°C. The GaN MESFET at 400°C showed degraded characteristics: a low gm of 13.4 mS/mm, a gate leakage and a poor pinch-off.

Cite

CITATION STYLE

APA

Egawa, T., Ishikawa, H., Jimbo, T., & Umeno, M. (1999). Heteroepitaxial growth of III-V compound semiconductors for optoelectronic devices. Bulletin of Materials Science, 22(3), 363–367. https://doi.org/10.1007/BF02749943

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free