Instrumental characterization of clay by XRF, XRD and FTIR

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Abstract

Instrumental characterizations of the clay were performed by different techniques such as XRF, XRD and FTIR. XRF shows the chemical compositions of the clay where Al-oxide and silica oxide are present in major quantity whereas XRD confirms the presence of these minerals in clay. FTIR studies show the presence of quartz, alumina, haematite and different mineral matters. © Indian Academy of Sciences.

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Nayak, P. S., & Singh, B. K. (2007). Instrumental characterization of clay by XRF, XRD and FTIR. Bulletin of Materials Science, 30(3), 235–238. https://doi.org/10.1007/s12034-007-0042-5

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