As IoT permeates through industry in general, the safety assurances of IoT will become a major issue. One of the major safety issues, stack overflow, is a bothersome and difficult problem because it is hard to discover during design and to prevent. Many related studies for preventing stack overflow have used two general methods. The static analysis method is employed before a program runs and estimates the program’s probable maximum stack memory usage. The dynamic analysis method is used to monitor for stack overflows during run-time. Based on those prior works, this paper introduces a method for monitoring stack memory based on static analysis of the maximum stack memory usage profile. We anticipate that applying the proposed approach will prevent stack overflow in an efficient manner.
CITATION STYLE
Choi, K., Kim, S., Seok, M. G., Cho, J., & Park, D. (2018). Maximum stack memory monitoring method assisted by static analysis of the stack usage profile. In Lecture Notes in Electrical Engineering (Vol. 474, pp. 756–765). Springer Verlag. https://doi.org/10.1007/978-981-10-7605-3_121
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