Quantum jidoka. Integration of quantum simulation on a cnc machine for in–process control visualization

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Abstract

With the advent of the Industry 4.0 paradigm, the possibilities of controlling manufacturing processes through the information provided by a network of sensors connected to work centers have expanded. Real-time monitoring of each parameter makes it possible to determine whether the values yielded by the corresponding sensor are in their normal operating range. In the interplay of the multitude of parameters, deterministic analysis quickly becomes intractable and one enters the realm of “uncertain knowledge”. Bayesian decision networks are a recognized tool to control the effects of conditional probabilities in such systems. However, determining whether a manufacturing process is out of range requires significant computation time for a decision network, thus delaying the triggering of a malfunction alarm. From its origins, Jidoka was conceived as a means to provide mechanisms to facilitate real-time identification of malfunctions in any step of the process, so that the production line could be stopped, the cause of the disruption identified for resolution, and ultimately the number of defective parts minimized. Our hypothesis is that we can model the internal sensor network of a computer numerical control (CNC) machine with quantum simulations that show better performance than classical models based on decision networks. We show a successful test of our hypothesis by implementing a quantum digital twin that allows for the integration of quantum computing and Industry 4.0. This quantum digital twin simulates the intricate sensor network within a machine and permits, due to its high computational performance, to apply Jidoka in real time within manufacturing processes.

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CITATION STYLE

APA

Villalba-Diez, J., Gutierrez, M., Grijalvo Martín, M., Sterkenburgh, T., Carlos Losada, J., & María Benito, R. (2021). Quantum jidoka. Integration of quantum simulation on a cnc machine for in–process control visualization. Sensors, 21(15). https://doi.org/10.3390/s21155031

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