HALT and HASS Overview: The New Quality and Reliability Paradigm

Abstract

Highly accelerated life tests (HALT) and highly accelerated stress screens (HASS) are introduced and discussed in this chapter. A few successes from each technique are described. These techniques have been successfully used by the author, and some of the author’s consulting clients and seminar attendees for more than 38 years. Most of the accomplished users do not publish their results because of the pronounced financial and technical advantages of the techniques over the classical methods, which are not even in the same league in terms of speed and cost. It is important to note that the methods are still evolving as is the equipment required in order to implement the techniques. This chapter is an overview of the methods and also gives a partial chronology of their development. Full details are available in [1] and [2]. 36.1