Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
CITATION STYLE
Eggert, F., Elam, T., Anderhalt, R., & Nicolosi, J. (2011). Automated Qualitative Element Analysis of EDS Spectra with Considering Pile-Up Distortions in High Count-Rate Modes. Microscopy and Microanalysis, 17(S2), 1192–1193. https://doi.org/10.1017/s1431927611006830
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