Abstract
In this paper a method for cleaning tantalum capacitors terminals, using the technique of selective ablation by pulsed laser is proposed. Such ablation is studied by the LIBS technique to characterize capacitors and determine the resin composition and possible contaminants adhered. In addition, OCT measurements are performed to recreate the damage done to the samples.
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Villarreal, A. E., Frías, A. K., Rendón, F. G., Flores, T., Ponce, L., & Vázquez-Bautista, G. (2017). Cleaning of tantalum capacitor electrode surface by laser in multipulse regime. In Conference Proceedings of the Society for Experimental Mechanics Series (Vol. 2017-January, pp. 345–353). Springer New York LLC. https://doi.org/10.1007/978-3-319-28513-9_48
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