Introduction

Abstract

Since the publication of Noncontact Atomic Force Microscopy Vol. 2 in 2009, the noncontact atomic force microscope (NC-AFM), which can image even insulators with atomic resolution, has achieved remarkable technical progress especially on (a) Tip Modification, (b) Control of Atomic Force, and (c) qPlus Sensor/Quartz Tuning Fork. This third volume deals with the following outstanding progress obtained with atomic resolution after the publication of the previous book: (1) Force Spectroscopy and Force-Mapping with Atomic Resolution, (2) Repulsive Force Imaging, (3) AFM/STM combined measurements, (4) Atomic/Molecular Manipulation, (5) Atomic/Submolecular Imaging in Liquids. These results and technologies are varying the NC-AFM with imaging function on an atomic scale toward characterization and manipulation tools of individual atoms/molecules and nanostructures with atomic/subatomic resolution noticeably. Therefore, the NC-AFM is becoming a crucial tool for nanoscience and nanotechnology much more.