Combination of X-ray powder diffraction, electron diffraction and HRTEM data

Abstract

A combination of X-ray and electron scattering data can facilitate structure analysis of polycrystalline materials that are problematic to study by conventional methods. Different electron diffraction data collection techniques as well as high-resolution imaging are described. A number of diverse algorithms of data combination and their applications to structural analysis of several materials systems are provided. © 2012 Springer Science+Business Media Dordrecht.