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Book Chapter

High-Speed Characterization

  • Bhushan M
  • Ketchen M
Springer New York, (2011), 231-257
DOI: 10.1007/978-1-4419-9377-9_7
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Bhushan, M., & Ketchen, M. B. (2011). High-Speed Characterization. In Microelectronic Test Structures for CMOS Technology (pp. 231–257). Springer New York. https://doi.org/10.1007/978-1-4419-9377-9_7

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