This paper reports, for the first time, on the application of apodization techniques to 900 MHz MEMS AlN Contour-Mode Resonators (CMRs [1]) to efficiently suppress spurious modes in close proximity of the main mechanical resonance. This concept has been applied with excellent results to a variety of one port resonators formed by patterned top electrodes made out of Aluminum, and a floating bottom electrode made out of Platinum sandwiching the AlN film. As also predicted by 3D COMSOL simulations, a complete elimination of spurious responses in the admittance plot of these resonators is attained without impacting their Q or electromechanical coupling coefficient, kt2.
CITATION STYLE
Giovannini, M., Yazici, S., Kuo, N. K., & Piazza, G. (2012). Apodization techniques for spurious mode suppression in 900 MHz aluminum nitride contour-mode resonators. In Technical Digest - Solid-State Sensors, Actuators, and Microsystems Workshop (pp. 351–354). Transducer Research Foundation. https://doi.org/10.31438/trf.hh2012.93
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