FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holography

Ailliot, C., Barnes, J. P., Bertin, F., Cooper, D., Hartmann, J. M., & Rivallin, P. (2009). FIB prepared and Tripod polished prepared p-n junction specimens examined by off-axis electron holography. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 245–246). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_123