An erbium-doped silicon transistor prepared by ion implantation and co-doped with oxygen is investigated by photocurrent generation in the telecommunication range. The photocurrent is explored at room temperature as a function of the wavelength by using a supercontinuum laser source working in the µW range. The 1-µm 2 transistor is tuned to involve in the transport only those electrons lying in the Er-O states. The spectrally resolved photocurrent is characterized by the typical absorption line of erbium and the linear dependence of the signal over the impinging power demonstrates that the Er-doped transistor is operating far from saturation. The relatively small number of estimated photoexcited atoms (≈4 × 10 4 ) makes Er-dpoed silicon potentially suitable for designing resonance-based frequency selective single photon detectors at 1550 nm.
CITATION STYLE
Celebrano, M., Ghirardini, L., Finazzi, M., Ferrari, G., Chiba, Y., Abdelghafar, A., … Prati, E. (2019). Room temperature resonant photocurrent in an erbium low-doped silicon transistor at telecom wavelength. Nanomaterials, 9(3). https://doi.org/10.3390/nano9030416
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