An erbium-doped silicon transistor prepared by ion implantation and co-doped with oxygen is investigated by photocurrent generation in the telecommunication range. The photocurrent is explored at room temperature as a function of the wavelength by using a supercontinuum laser source working in the µW range. The 1-µm 2 transistor is tuned to involve in the transport only those electrons lying in the Er-O states. The spectrally resolved photocurrent is characterized by the typical absorption line of erbium and the linear dependence of the signal over the impinging power demonstrates that the Er-doped transistor is operating far from saturation. The relatively small number of estimated photoexcited atoms (≈4 × 10 4 ) makes Er-dpoed silicon potentially suitable for designing resonance-based frequency selective single photon detectors at 1550 nm.
Mendeley helps you to discover research relevant for your work.
CITATION STYLE
Celebrano, M., Ghirardini, L., Finazzi, M., Ferrari, G., Chiba, Y., Abdelghafar, A., … Prati, E. (2019). Room temperature resonant photocurrent in an erbium low-doped silicon transistor at telecom wavelength. Nanomaterials, 9(3). https://doi.org/10.3390/nano9030416