Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs

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Abstract

Spectroscopic ellipsometry is used to measure the dielectric function of heavily doped p-type GaAs for wave numbers from 100 to 2000 cm-1. Due to partial filling of the heavy-and light-hole valence bands, heavy holes as well as light holes form a multiple-component plasma coupled with longitudinal optical phonons. Line-shape analysis of the infrared response allows differentiating between light- and heavy-hole contributions to the carrier plasma, and the results observed suggest nonparabolicity effects of the heavy- and light-hole valence bands in GaAs. © 2001 American Institute of Physics.

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Zangooie, S., Schubert, M., Thompson, D. W., & Woollam, J. A. (2001). Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs. Applied Physics Letters, 78(7), 937–939. https://doi.org/10.1063/1.1343490

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