A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
CITATION STYLE
Levcenko, S., Biller, R., Pfeiffelmann, T., Ritter, K., Falk, H. H., Wang, T., … Kvashnina, K. (2022). High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III. Journal of Synchrotron Radiation, 29(Pt 5), 1209–1215. https://doi.org/10.1107/S1600577522007287
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