High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III

1Citations
Citations of this article
6Readers
Mendeley users who have this article in their library.

This article is free to access.

Abstract

A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.

Author supplied keywords

Cite

CITATION STYLE

APA

Levcenko, S., Biller, R., Pfeiffelmann, T., Ritter, K., Falk, H. H., Wang, T., … Kvashnina, K. (2022). High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III. Journal of Synchrotron Radiation, 29(Pt 5), 1209–1215. https://doi.org/10.1107/S1600577522007287

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free