Determination of passive and semi-passive chip parameters required for synthesis of interrogation zone in UHF RFID systems

Abstract

In this paper, authors disclose the methodology of interrogation zone synthesis that comprehensively covers all aspects connected with determination of RFID device parameters. The effective methods of involved parameter determination for passive and semi-passive UHF RFID chips are presented. The elaborated measuring procedures have been verified experimentally and are discussed in details. The special untypical laboratory stand has been prepared for carrying out the research tasks. Furthermore, the importance of the parameters for the interrogation zone synthesis is described methodically. In addition, the special software tools that allow researchers to effectively conduct investigations on protocol parameter modifications both in new-developed as well as approved standards (e.g. ISO/IEC 18000-6c) have been designed. These facilities can significantly support many theoretical and simulation works that are developed and described in the branch literature and can improve the reliability and efficiency of designed RFID applications.