CITATION STYLE
Linck, M. (2009). Imaging parameters for optimized noise properties in high-resolution off-axis holograms in a Cs-corrected TEM. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 241–242). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_121
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