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A method for extracting the threshold voltage of MOSFET based on current components

  • K. A
Edited by
  • Ryssel H
  • Pichler P
Simulation of Semiconductor Devices and Processes (1995)
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K., A. (1995). A method for extracting the threshold voltage of MOSFET based on current components. In H. Ryssel & P. Pichler (Eds.), Simulation of Semiconductor Devices and Processes. Vienna: Springer Vienna. Retrieved from http://link.springer.com/10.1007/978-3-7091-6619-2

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