Abstract
The measured birefringence of the refractive indices of GaAs-AlAs multilayers grown by molecular beam epitaxy is found to vary from 0.056 at 0.9 μm to 0.042 at 1.1 μm.
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CITATION STYLE
APA
Van Der Ziel, J. P., Ilegems, M., & Mikulyak, R. M. (1976). Optical birefringence of thin GaAs-AlAs multilayer films. Applied Physics Letters, 28(12), 735–737. https://doi.org/10.1063/1.88634
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