Metrology of single-photon sources and detectors: a review

  • Chunnilall C
  • Degiovanni I
  • Kück S
  • et al.
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Abstract

Abstract.The generation, measurement, and manipulation of light at the single- and few-photon levels underpin a rapidly expanding range of applications. These range from applications moving into the few-photon regime in order to achieve improved sensitivity and/or energy efficiency, as well as new applications that operate solely in this regime, such as quantum key distribution and physical quantum random number generation. There is intensive research to develop new quantum optical technologies, for example, quantum sensing, simulation, and computing. These applications rely on the performance of the single-photon sources and detectors they employ; this review article gives an overview of the methods, both conventional and recently developed, that are available for measuring the performance of these devices, with traceability to the SI system.

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Chunnilall, C. J., Degiovanni, I. P., Kück, S., Müller, I., & Sinclair, A. G. (2014). Metrology of single-photon sources and detectors: a review. Optical Engineering, 53(8), 081910. https://doi.org/10.1117/1.oe.53.8.081910

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