Improvement in the Mass Resolution of Single Particle Mass Spectrometry Using Delayed Ion Extraction

Abstract

A specific delayed ion extraction (DIE) technique, which combines a standard rectangular extraction pulse with an exponential pulse, was introduced for a single particle mass spectrometry (SPMS) instrument, and it can focus ions in a wide mass range and results in a mass resolution improvement for the mass range of the studied ions. The experimental results indicate that the average mass resolution for positive ions is about 1000 when the mass-to-charge ratio (m/z) is greater than 70, and for negative ions, when the m/z is greater than 70, the average resolution can reach 2000. The highest mass resolutions achieved so far are 1260 for positive ions and 2400 for negative ions for SPMS, which are very beneficial for mass peak interpretation and chemical compound identification. The primary applications for atmospheric particle measurements show that the high mass resolution of SPMS with the DIE technique is very beneficial for the analysis of carbon and metallic element containing particles, and 39K+ with C3H3+ and 41K+ and C3H5+ in organic particles were successfully differentiated using SPMS. The results indicate that SPMS with DIE technique can significantly ease mass peak interpretation and improve the mass assignment ability during analysis. Furthermore, existing SPMS instruments can be improved by a facile retrofitting process to implement the DIE technique. [Figure not available: see fulltext.].