Abstract
Reliability of semiconductor optical devices used in recent systems and equipment is described from an aspect of the degradation mechanisms observed on various reliability tests. The degradation mechanisms clarified for last three decades still govern the device reliability in recent systems and equipment. The reliability of optical devices is limited with the change rate of the device characteristics in systems and equipment, and the rate is governed by the degradation mechanisms. The correlations between degradation mechanisms and the change rates of device characteristics are also reviewed and discussed in this chapter.
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CITATION STYLE
Fukuda, M. (2013). Reliability testing of semiconductor optical devices. In Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (pp. 3–17). Springer New York. https://doi.org/10.1007/978-1-4614-4337-7_1
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