High-Resolution Imaging and Force Spectroscopy of Fungal Hyphal Cells by Atomic Force Microscopy

Abstract

Various forms of microscopy applied to image fungal hyphae have been limited by either diffraction or the ability to image viable specimens. The advent of the atomic force microscope offered the opportunity to image live fungal hyphae under ambient conditions at very high resolution. The force spectroscopy capabilities of the microscope facilitate physical and chemical characterization of the fungal cell surface. In this chapter, we describe the detailed protocols that have allowed high-resolution imaging and force spectroscopy of fungal spores, germinants, and hyphae for both fixed and viable specimens.