Various feature extraction and classification techniques

Abstract

This work concentrates on techniques for feature extraction and selection. Feature extraction plays an important role in image processing. The discrete cosine transform (DCT), discrete Fourier transform (DFT) and wavelet transform (WT) are used for feature extraction. For optimal feature selection, PCA and ICA statistical techniques are used. Then, classification technique support vector machine (SVM) is discussed. PCA and ICA performance is compared in SVM. Classification is proposed for detecting defects.