Quantifying Deformation at the Micro- and Nanoscale Using In Situ Electron and 3D Confocal Microscopy

D Gianola; L Chen; R McCaffrey; K Murphy

Journal ArticleOPEN ACCESS

Quantifying Deformation at the Micro- and Nanoscale Using In Situ Electron and 3D Confocal Microscopy

Gianola D
Chen L
McCaffrey R
et al.

Microscopy and Microanalysis (2011) 17(S2) 428-429

DOI: 10.1017/s1431927611003011

N/ACitations

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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CITATION STYLE

APA

Gianola, D., Chen, L., McCaffrey, R., & Murphy, K. (2011). Quantifying Deformation at the Micro- and Nanoscale Using In Situ Electron and 3D Confocal Microscopy. Microscopy and Microanalysis, 17(S2), 428–429. https://doi.org/10.1017/s1431927611003011

Quantifying Deformation at the Micro- and Nanoscale Using In Situ Electron and 3D Confocal Microscopy

Abstract

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