Applications of Atomic-Resolution EELS Mapping at Low kV

B Schaffer; F Azough; D Abou-Ras; S Schmidt; M Schaffer; M Sarahan; Q Ramasse; R Caballero

Journal ArticleOPEN ACCESS

Applications of Atomic-Resolution EELS Mapping at Low kV

Schaffer B
Azough F
Abou-Ras D
et al.

Microscopy and Microanalysis (2011) 17(S2) 786-787

DOI: 10.1017/s1431927611004806

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6Readers

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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APA

Schaffer, B., Azough, F., Abou-Ras, D., Schmidt, S., Schaffer, M., Sarahan, M., … Caballero, R. (2011). Applications of Atomic-Resolution EELS Mapping at Low kV. Microscopy and Microanalysis, 17(S2), 786–787. https://doi.org/10.1017/s1431927611004806

Applications of Atomic-Resolution EELS Mapping at Low kV

Abstract

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