We identify a new mechanism for generation of the microbunching instability that involves the transverse rather than the longitudinal component of the self-fields. We introduce an analytical model that captures the essential features of the effect and use the model to interpret results from recent LCLS-II design studies.
CITATION STYLE
Venturini, M., & Qiang, J. (2015). Transverse space-charge induced microbunching instability in high-brightness electron bunches. Physical Review Special Topics - Accelerators and Beams, 18(5). https://doi.org/10.1103/PhysRevSTAB.18.054401
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