Characteristics of InGaN multi-quantum-well-structure laser diodes

149Citations
Citations of this article
43Readers
Mendeley users who have this article in their library.
Get full text

Abstract

InGaN multi-quantum-well (MQW)-structure laser diodes fabricated from III-V nitride materials were grown by metalorganic chemical vapor deposition on (111) MgAl2O4 substrates. The laser consisted of a InGaN MQW, GaN optical guiding layers and AlGaN cladding layers. The observed stimulated emission was at a wavelength around 419 nm, with a threshold current of 320 mA (13 kA/cm2) and a threshold voltage of 28 V under pulsed current injection at room temperature. The stimulated emission also showed a strong transverse electric polarization. The beam full widths at half power for the parallel and perpendicular far-field radiation patterns were 5° and 17°, respectively. © 1996 American Institute of Physics.

Cite

CITATION STYLE

APA

Nakamura, S., Senoh, M., Nagahama, S. I., Iwasa, N., Yamada, T., Matsushita, T., … Sugimoto, Y. (1996). Characteristics of InGaN multi-quantum-well-structure laser diodes. Applied Physics Letters, 68(23), 3269–3271. https://doi.org/10.1063/1.116570

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free