CITATION STYLE
Hüe, F., Houdellier, F., Snoeck, E., Destefanis, V., Hartmann, J. M., Bender, H., … Hÿtch, M. J. (2009). Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 123–124). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_62
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