Electrical characterization and hydrogen gas sensing properties of a n-ZnO/p-SiC Pt-gate metal semiconductor field effect transistor

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Abstract

A new hydrogen gas sensitive n-ZnOp-SiC Pt-gate metal semiconductor field effect transistor (MESFET) is reported. The observed current-voltage curves for the source to drain region indicate that this MESFET operates in enhancement mode. A change in gate potential, due to different ambient atmospheres caused a change in the width of the depletion region, hence modulating the current in the n channel (ZnO layer). The H2 gas sensing mechanism of the presented MESFET structure is discussed using energy band diagrams. © 2007 American Institute of Physics.

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Kandasamy, S., Wlodarski, W., Holland, A., Nakagomi, S., & Kokubun, Y. (2007). Electrical characterization and hydrogen gas sensing properties of a n-ZnO/p-SiC Pt-gate metal semiconductor field effect transistor. Applied Physics Letters, 90(6). https://doi.org/10.1063/1.2450668

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