An improved upward planarity testing algorithm and related applications

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Abstract

We consider the standard algorithm to test the upward planarity of embedded digraphs by Bertolazzi et al. [3]. We show how to improve its running time from O(n + r 2) to O(n + r 3/2 ), where r is the number of sources and sinks in the digraph.We also discuss 2 applications of this technique: finding a certificate of correctness of an implementation of our upward planarity testing algorithm; and improving the running time of getting a quasi-upward planar drawing for an embedded digraph with minimum number of bends. © Springer-Verlag Berlin Heidelberg 2009.

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APA

Abbasi, S., Healy, P., & Rextin, A. (2009). An improved upward planarity testing algorithm and related applications. In Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) (Vol. 5431 LNCS, pp. 334–344). https://doi.org/10.1007/978-3-642-00202-1_29

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