Fault injection and key retrieval experiments on an evaluation board

Abstract

This chapter presents fault injection experiments using a side-channel evaluation board called SASEBO, which was developed to unify testing environments for side-channel analysis. We describe experiments where faults were injected into a cryptographic LSI mounted on a SASEBO board using a clock glitch. In this experiment, the faults can be induced at any desired point in time during the computation of an algorithm. We show the results of injecting faults into block cipher and public key modules implemented on the LSI. We also show the key retrieval from standard ciphers using the faulty outputs obtained in these experiments. This work contributes to the study of how a fault is injected into a target device, such as an LSI mounted on an evaluation board, and verifies various theoretical fault analyses using an experimental environment.