CITATION STYLE
Walther, T., Atkinson, K., Sweeney, F., & Rodenburg, J. M. (2008). Measuring coherence in an electron beam for imaging. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 165–166). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_83
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