Optically triggered multilevel resistive switching characteristics of Cu/MoS2/AlN/ITO bilayer memory structure

Abstract

In this work, the tunable resistive switching (RS) functionality of a Cu/MoS2/AlN/ITO nanostructured device is systematically investigated in dark and white light illumination. The device exhibits bi-state RS behavior in the dark ambient, whereas light illumination induces an extra intermediate resistance state and provides controllable tri-state RS characteristics. A conceptual model is proposed and discussed to elucidate the origin of the switching behavior of two resistance states and multiple resistance states of the device. Under the dark ambient condition, the high resistance state and the low resistance state in the device could be ascribed to the formation/rupture of a Cu metallic filamentary path between the electrodes. However, the formation of an additional ionic filament via trapping/detrapping of electrons in nitride-sulfide-related vacancies along with the Cu metallic filament is responsible for the tri-state switching under the light illumination. Interestingly, the variation of SET voltage with applied light intensity has also been demonstrated. The calculated value of the temperature coefficient and temperature dependency of resistance in various resistance states confirms the existence of the proposed model. The device performed a good undispersed endurance up to 1.5 × 103 cycles and stable retention over 103 s at room temperature. This optical activity dependent functionality of the device provides a possibility to extend resistive switching-based nonvolatile random access memory applications to the optical domain such as imaging sensors, photodetectors, and optoelectronic switches.