Positional accuracy of optical vortex metrology (OVM)

Beyer, V., Wang, W., & Moore, A. J. (2014). Positional accuracy of optical vortex metrology (OVM). In Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology (pp. 329–332). springer berlin. https://doi.org/10.1007/978-3-642-36359-7_58