CITATION STYLE
YAMASHITA, M., NIKAWA, K., TONOUCHI, M., OTANI, C., & KAWASE, K. (2005). Laser THz Emission Microscope for LSI Failure Analysis. The Review of Laser Engineering, 33(12), 855–859. https://doi.org/10.2184/lsj.33.855
Mendeley helps you to discover research relevant for your work.