Reliability offers significant modeling challenges. Typically, parts cannot be tested until failure under normal operating conditions. Since the target is frequently a decade or longer of useful life, this is impractical. Consequently, accelerated testing is performed. This procedure only works when the physics is well understood, and the failure mechanism is not accelerated by factors not under the control of the testing. Consequently, modeling of the failure mechanism is crucial in making extrapolated predictions of lifetime. Technology Computer-Aided Design tools have advanced to the point where multiple physics can be included and the testing simulated fully. This chapter describes such an extended tool and provides examples of applying it to the understanding of two different failure mechanisms.
CITATION STYLE
Law, M. E., Griglione, M., Patrick, E., Rowsey, N., & Horton, D. (2013). Reliability simulation. In Materials and Reliability Handbook for Semiconductor Optical and Electron Devices (pp. 515–544). Springer New York. https://doi.org/10.1007/978-1-4614-4337-7_16
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