We describe a technique for measuring the local geometrical thickness of semi-transparent thin films by means of the diffractive properties of a transmitted Gaussian beam. In particular, we measure the semi-width of a beam transmitted through the sample with a homodyne technique especially devised for this purpose. We present analytical and experimental results with our technique.
CITATION STYLE
Cywiak, M., Olvera-R, O., & Cervantes-L, J. (2017). Geometrical thickness measurement of thin films by a transmitted gaussian beam. In Conference Proceedings of the Society for Experimental Mechanics Series (Vol. 2017-January, pp. 131–134). Springer New York LLC. https://doi.org/10.1007/978-3-319-28513-9_18
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