Testing of side-channel leakage of cryptographic intellectual properties: Metrics and evaluations

Abstract

Embedded cryptographic IP forms the basis of security in a modern system on chip. Therefore such cryptographic IPs must be equipped with side-channel countermeasures and tested thoroughly. However testing side-channel resistance by performing a group of attacks is sub-optimal and not comprehensive. In recent years, efficient testing mechanisms based on statistical tests have been proposed which makes side-channel testing fast, robust, and more importantly error free. In this chapter, we will focus on three such metrics: Guessing Entropy, Normalized Inter-Class Variance (NICV), and Test Vector Leakage Assessment (TVLA). We provide the statistical background needed for proper understanding of these tests, along with practical case studies on real unprotected and protected targets.