Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope

  • Michael J
N/ACitations
Citations of this article
8Readers
Mendeley users who have this article in their library.
Get full text

Abstract

Backscatter Kikuchi Diffraction patterns were obtained in a scanning electron microscope from a small rock fragment which had been identified using x-ray fluorescence analysis as a lead oxychloride. The angular range of reciprocal space captured in the patterns was 130-degrees and within this range only 1 symmtry axis was observed. It was identified as 2mm which permitted the crystal to be identified as orthorhombic. Analysis showed that the a:b ratio was close to 1 and the a:c ratio close to 4. The analysis confirmed earlier x-ray powder diffraction studies that the fragment was very similar to Blixite.

Cite

CITATION STYLE

APA

Michael, J. R. (2000). Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope. In Electron Backscatter Diffraction in Materials Science (pp. 75–89). Springer US. https://doi.org/10.1007/978-1-4757-3205-4_7

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free