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CITATION STYLE
APA
Sachdev, M., & Gyvez, J. P. de. (2007). Functional and Parametric Defect Models. In Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (pp. 23–67). Springer US. https://doi.org/10.1007/0-387-46547-2_2
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