Scanning Probe Microscopy: Tipping the Path Toward Atomic Visions

Abstract

The Scanning Probe Microscopy (SPMs) are a set of techniques to obtain information about composition, structure, electric and magnetic properties, between other, of the surface of different samples, from scale to atomic scale, which also have the ability even to modify its surfaces. SPMs include Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Scanning Electrochemical Microscopy (SECM). In this chapter, the fundamentals of SPMs, basic devices, and the signal response used to generate the sample surface image are reviewed. With emphasis on the AFM technique, its operation modes are described, further describes the purpose of the measurements, as well as artifacts that may affect the results and recommendations for solving them. Recommendations for successful imaging and processing tips, as well as good experimental practices are provided. Different applications examples and the results obtained are shown. This chapter aims to provide to non-specialized readers in SPMs an overview of surface characterization techniques, their advantages, and limitations.