Scanning probe microscopes

Abstract

Scanning probe microscopes (SPMs) are among the most powerful surface-study techniques for metals, polymers, and ceramics, by virtue of their high resolution (atomic level), ease of sample-preparation, and possibility of digitized data analysis. This article discusses how such SPMs as atomic force microscopes and scanning tunneling microscopes have been used to study several PAN-based carbon fibers in order to provide new understanding of fiber-polymide matrix interfacial interactions in advanced composites. The better the adhesion between fibers and matrix, the better the high temperature performance, which translates to slower loss of both weight and interlaminar shear strength.