Characterization challenges with porous silicon

Abstract

Mesoporous silicon is a complex nanostructure whose optoelectronic properties and morphology have received intense study over the last 25 years. Its properties often depend on both its skeleton size distribution and the chemical nature of its high internal surface area. This review collates some of the lessons learned with regard characterization, highlighting potential issues that need to be considered and artifacts that can arise. These have in the past both complicated data interpretation and even caused problems in reproducing published data.