Bayesian acceptance sampling plan for exponential distribution under type-I and type-II censoring

Abstract

This paper studies the design method in engineering for Bayesian acceptance sampling plan under exponential distribution. In reliability theory, the exponential distribution is the most basic and common distribution, plan is widely applicable. First, aiming at the two kinds of truncation method (type-I and type-II censoring), we give the Bayesian posterior expression of the producer and consumer risk according to the Average risk criteria and Posterior risk criteria respectively. Second, in the specific analysis, using the Gamma distribution as the prior distribution of failure rate, we obtain the test plan of different truncated modes and the test plan of different risk criteria as well as the classical methods are compared, the results show that the application of Bayes plan can greatly reduce the test cost. Third, the influence of the prior distribution on the Bayes plan is studied.