A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip

Sokolov, I. Yu., Henderson, G. S., & Wicks, F. J. (2005). A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip. In Atomic Force Microscopy/Scanning Tunneling Microscopy 3 (pp. 87–95). Kluwer Academic Publishers. https://doi.org/10.1007/0-306-47095-0_8